DocumentCode
3558706
Title
Measurement Range Increase of a Phase-Shift Laser Rangefinder Using a CMOS Analog Neural Network
Author
Gatet, Laurent ; Tap-B?©teille, H?©l?¨ne
Volume
58
Issue
6
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
1911
Lastpage
1918
Abstract
An analog neural network (NN) was designed, implemented in 0.35-mum complementary metal-oxide-semiconductor technology, and tested to increase the distance measurement interval of a phase-shift laser rangefinder and to classify different types of surfaces for varying distances and incidence angles. This paper focuses on the ability of the NN to remove the indecision on the distance value deduced from the phase-shift measurement. The NN architecture is a multilayer perceptron (MLP) with two inputs, three processing neurons in the hidden layer, and one output neuron. The amplified and filtered photoelectric signal provided by the rangefinder is set at one input. The NN is trained so that its output voltage is proportional to the distance for easy evaluation. By combining both measurements coming from the rangefinder and the NN, it is possible to obtain a resolution of 50 mum on a distance interval [0.5 m; 3.2 m], whereas the rangefinder measurement range width is limited to 0.9 m. This paper presents the complete system, concentrating more on the training phase of the implemented NN and on the experimental results.
Keywords
CMOS analogue integrated circuits; MIS devices; distance measurement; laser ranging; multilayer perceptrons; phase shifters; CMOS analog neural network; distance measurement interval; metal-oxide-semiconductor technology; multilayer perceptron; phase-shift laser rangefinder; phase-shift measurement; Analog processing circuits; NN hardware; complementary metal–oxide–semiconductor (CMOS) analog integrated circuits; complementary metal–oxide–semiconductor (CMOS) analog integrated circuits; distance measurement; laser applications; multilayer perceptron (MLP); neural network (NN) applications; phase-shift laser rangefinder;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
Conference_Location
10/10/2008 12:00:00 AM
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2008.2005854
Filename
4648441
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