DocumentCode
3558742
Title
Prediction limits for an exponential distribution: a Bayes predictive distribution approach
Author
Upadhyay, S.K. ; Pandey, M.
Author_Institution
Dept. of Stat., Banaras Hindu Univ., Varanasi, India
Volume
38
Issue
5
fYear
1989
fDate
12/1/1989 12:00:00 AM
Firstpage
599
Lastpage
602
Abstract
A life testing experiment that has a one-parameter exponential distribution with constant failure rate is considered. Using the gamma prior, the authors derive the posterior distribution for that failure rate and hence the predictive distribution of future observations. Available data are from type II censored sampling. Methods are derived for constructing prediction limits for the j th smallest of some set of future observations from the same failure process using the predictive distribution. On the basis of a Monte Carlo study of 1000 future samples, the proportion of times the limits include the first future observation (as a particular case for numerical illustration) has been obtained and found to be very high. The results are compared with the classical limits derived by J.F. Lawless in 1972
Keywords
Bayes methods; failure analysis; life testing; reliability theory; Bayes predictive distribution approach; Monte Carlo study; constant failure rate; exponential distribution; future observations; gamma prior; life testing experiment; posterior distribution; prediction limits; reliability; type II censored sampling; Art; Exponential distribution; Life testing; Monte Carlo methods; Probability distribution; Reliability theory; Sampling methods; Statistical analysis; Statistical distributions; Weibull distribution;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
Conference_Location
12/1/1989 12:00:00 AM
ISSN
0018-9529
Type
jour
DOI
10.1109/24.46488
Filename
46488
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