• DocumentCode
    3558742
  • Title

    Prediction limits for an exponential distribution: a Bayes predictive distribution approach

  • Author

    Upadhyay, S.K. ; Pandey, M.

  • Author_Institution
    Dept. of Stat., Banaras Hindu Univ., Varanasi, India
  • Volume
    38
  • Issue
    5
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    599
  • Lastpage
    602
  • Abstract
    A life testing experiment that has a one-parameter exponential distribution with constant failure rate is considered. Using the gamma prior, the authors derive the posterior distribution for that failure rate and hence the predictive distribution of future observations. Available data are from type II censored sampling. Methods are derived for constructing prediction limits for the jth smallest of some set of future observations from the same failure process using the predictive distribution. On the basis of a Monte Carlo study of 1000 future samples, the proportion of times the limits include the first future observation (as a particular case for numerical illustration) has been obtained and found to be very high. The results are compared with the classical limits derived by J.F. Lawless in 1972
  • Keywords
    Bayes methods; failure analysis; life testing; reliability theory; Bayes predictive distribution approach; Monte Carlo study; constant failure rate; exponential distribution; future observations; gamma prior; life testing experiment; posterior distribution; prediction limits; reliability; type II censored sampling; Art; Exponential distribution; Life testing; Monte Carlo methods; Probability distribution; Reliability theory; Sampling methods; Statistical analysis; Statistical distributions; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    12/1/1989 12:00:00 AM
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.46488
  • Filename
    46488