Title :
The Temporal Drift Due to Polarization Noise in a Photonic Phase Reference Distribution System
Author :
Shen, Pengbo ; Gomes, Nathan J. ; Shillue, William P. ; Albanna, Sarmad
Author_Institution :
Electron. Dept., Univ. of Kent, Canterbury
Abstract :
The temporal drift due to the polarization noise in an ultralow temporal drift photonic phase reference distribution system is analyzed. The temporal drift is shown to be associated with the polarization changes, the differential group delay of the subsequent parts, and, the state of polarization dispersion of the photonic local oscillator signal. Such temporal drift cannot be corrected by line length correction schemes. As an example, polarization changes from a fiber stretcher are presented, discussed, and identified as one of the major contributors to the system temporal drift. A numerical model is developed. The magnitude and statistical distribution (based on random coupling) of the temporal drift excited by the polarization change of the fiber stretcher are investigated. Experimental work demonstrates that reduction in the polarization change successfully reduces the temporal drift, as predicted by the theory and simulation.
Keywords :
delays; frequency synthesizers; jitter; numerical analysis; optical fibre dispersion; optical fibre polarisation; optical fibre testing; optical noise; statistical distributions; differential group delay; frequency synthesizers; optical fiber stretcher; phase jitter; phased array; photonic local oscillator signal; photonic phase reference distribution system; polarization mode dispersion; polarization noise; statistical distribution; temporal drift; Delay; Fiber lasers; Laser mode locking; Local oscillators; Optical fiber losses; Optical fiber polarization; Phase noise; Phased arrays; Radio astronomy; Stability; Phased array; frequency synthesizers; optical fiber; phase jitter; phase reference system; photonic local oscillator; polarization; polarization mode dispersion; temporal drift;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.927780