Title :
Surface-Response-Based Modeling of Digitizers: A Case Study on a Fast Digital Integrator at CERN
Author :
Arpaia, Pasquale ; Inglese, Vitaliano ; Spiezia, Giovanni ; Tiso, Stefano
Author_Institution :
Dept. of Eng., Univ. of Sannio, Benevento
fDate :
6/1/2009 12:00:00 AM
Abstract :
A statistical approach to simulation in behavioral modeling for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on a statistical experimental design allows operating conditions to be systematically and comprehensively explored, simulation to be optimized, and identification and validation uncertainty to be verified. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at the European Organization for Nuclear Research (CERN) is presented.
Keywords :
design of experiments; digital integrated circuits; CERN; behavioral modeling; dynamic metrological performance; fast digital integrator; statistical approach; statistical experimental design; surface-response-based digitizer modeling; validation uncertainty; Analog-to-digital conversion (ADC); error analysis; identification; modeling; statistics;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Conference_Location :
10/14/2008 12:00:00 AM
DOI :
10.1109/TIM.2008.2005855
