Title :
Hybrid-Mode SRAM Sense Amplifiers: New Approach on Transistor Sizing
Author :
Anh-Tuan, Do ; Zhi-Hui, Kong ; Kiat-Seng, Yeo
Author_Institution :
Centre for Integrated Circuits & Syst., Nanyang Technol. Univ., Singapore
Abstract :
A novel high-speed sense amplifier for ultra-low-voltage SRAM applications is presented. It introduces a completely different way of sizing the aspect ratio of the transistors on the data-path, hence realizing a current-voltage hybrid mode Sense Amplifier. Extensive post-layout simulations have proved that the new Sense Amplifier provides both high-speed and low-power properties, with its delay and power reduced to 25.8% and 37.6% of those of the best prior art. It also offers a much better read-effectiveness and robustness against the bit- and data-line capacitances as well as VDD variations. Furthermore, the new Sense Amplifier is able to tolerate a large difference between the parasitic capacitances associated with the complementary DLs. It can operate down to a supply voltage of 0.9 V, the lowest reported for a 0.18 mum CMOS process. A modified cross-coupled amplifier is also introduced, allowing the Sense Amplifier to operate down to 0.55 V.
Keywords :
CMOS integrated circuits; SRAM chips; amplifiers; capacitance; high-speed integrated circuits; low-power electronics; CMOS; high-speed properties; hybrid-mode SRAM; low-power properties; parasitic capacitances; sense amplifiers; size 0.18 mum; transistor sizing; Delay; Differential amplifiers; Energy consumption; High power amplifiers; Integrated circuit technology; Parasitic capacitance; Power engineering and energy; Random access memory; Reliability engineering; Voltage; Low-power SRAM; low-voltage SRAM; sense amplifier (SA);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2008.2001965