DocumentCode :
355907
Title :
Benchmarking mid-range CAD tools in a diverse product environment: recommendations and results
Author :
Bauernschub, Richard A. ; King, Don E.
Author_Institution :
AAI Corp., Hunt Valley, MD, USA
Volume :
1
fYear :
2000
fDate :
2000
Lastpage :
198
Abstract :
Processing power increases of recent years, coupled with decreasing costs of both hardware and software, have combined to dramatically improve product designers´ access to CAD tools. Operations that were once only possible on expensive Unix-based workstations can now be performed on less expensive Windows-based personal computers. A new category of CAD tools (commonly described as “mid-range” tools) has emerged to exploit these trends. This paper outlines the process used to develop a custom benchmark test used to evaluate three mid-range CAD tools: Solid Edge v.6, Solid Works 98+, and Mechanical Desktop v.3. Specific objectives of the exercise were to compare the mid-range tools against the current Unix-based CAD tool in order to: (i) ascertain if significant “ease-of-use” could be realized, and (ii) determine what capabilities would be lost (if these tools replaced the current tool) or gained (if they were used to augment the current tool). Topics addressed include: identifying tool requirements, conducting initial screening, developing evaluation tests, specifying both objective and subjective scoring systems, performing the tests, and presenting the results to users and executive management. The effects of a diverse product line on the benchmarking activity are noted. Development of special requirements due to data transfer to and from other CAD and CAE tools is outlined
Keywords :
CAD; Mechanical Desktop v.3; Solid Edge v.6; Solid Works 98+; Unix; Windows NT; benchmarking; mid-range CAD tool; product design; Benchmark testing; Costs; Design automation; Hardware; Microcomputers; Product design; Software tools; Solids; System testing; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1089-9870
Print_ISBN :
0-7803-5912-7
Type :
conf
DOI :
10.1109/ITHERM.2000.866826
Filename :
866826
Link To Document :
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