DocumentCode :
3559176
Title :
Thermal aging micro-scale analysis of power transformer pressboard
Author :
Liao, Rui-jin ; Tang, Chao ; Yang, Li-jun ; Grzybowski, Stanislaw
Author_Institution :
State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing
Volume :
15
Issue :
5
fYear :
2008
fDate :
10/1/2008 12:00:00 AM
Firstpage :
1281
Lastpage :
1287
Abstract :
In order to analyze the thermal aging mechanism of the insulation paper inside the power transformer, a series of accelerated thermal aging tests were performed on pressboard. Subsequently, the atomic force microscope (AFM) together with scanning electron microscope (SEM) and X-ray diffraction (X-RD) were utilized to observe the micro surface of the thermal-aged pressboard. The experiments and analysis indicate that either the links among the D-glucopyranose units or the hexagonal mesh structures of the D-glucopyranose units were broken under thermal stress; the number of D-glucopyranose units after 6 weeks of aging was 0.8-1 per nm2, only about one third of un-aged value. The wall of a cellulose cell was deteriorated and thinned by thermal stress. At the same time, the cracks expanded gradually on the surface of the cellulose, which shortened the average width of cellulose fiber from about 40 mu of un-aged sample to about 25 mu after 6 weeks of aging. Meanwhile, the relative crystallinity and the size of the crystallite in the pressboard decreased nonlinearly with the thermal aging time.
Keywords :
X-ray diffraction; ageing; atomic force microscopy; insulation testing; life testing; natural fibres; paper; power transformer insulation; power transformer testing; scanning electron microscopy; thermal stress cracking; AFM; D-glucopyranose units; SEM; X-ray diffraction; XRD; accelerated thermal aging tests; atomic force microscope; cellulose cell wall; cellulose fiber; cellulose surface; cracks expansion; crystallite size; hexagonal mesh structures; insulation paper; micro-scale analysis; power transformer pressboard; relative crystallinity; scanning electron microscope; thermal stress; time 6 week; Accelerated aging; Atomic force microscopy; Crystallization; Life estimation; Performance analysis; Power transformer insulation; Power transformers; Scanning electron microscopy; Thermal force; Thermal stresses; Thermal aging; X-ray diffraction (XRD); atomic force microscope (AFM); insulation; power transformer; pressboard; scanning electron microscope (SEM);
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
Conference_Location :
10/1/2008 12:00:00 AM
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2008.4656235
Filename :
4656235
Link To Document :
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