• DocumentCode
    3559216
  • Title

    High Detection Performance of Particle Detectors Based on SI InP Doped With Ti and Zn

  • Author

    Gorodynskyy, V. ; Yatskiv, R. ; Zdansky, K. ; Pekarek, L.

  • Author_Institution
    Dept. of Diagnostics, Inst. of Photonics & Electron. AS CR, Prague
  • Volume
    55
  • Issue
    5
  • fYear
    2008
  • Firstpage
    2785
  • Lastpage
    2788
  • Abstract
    In this work, we present results of measurements of spectra of alpha-particles carried out on semi-insulating (SI) InP detectors. The detectors were fabricated from Ti and Zn co-doped SI InP crystals grown by Czochralski technique. Tests of detectors performance with alpha-particles emitted from 241Am (5.48 MeV) radioactive source are reported. Excellent detectors performance has been evaluated by values of charge collection efficiency 99% and energy resolution ~ 1% obtained from the spectra measured at 230 K. Such high performance can be explained by InP doping with suitable Ti atoms and co-doping with low concentration of Zn acceptors sufficient for the full compensation of shallow donors, to reach SI properties. The electron mobility of reported SI InP detectors co-doped with Ti and Zn has been found to be equal to 2510 cm2 V-1 s-1 at room temperature. This value is much higher than that obtained previously with our SI InP co-doped with Ti and Mn or with InP crystals converted to SI state by temperature annealing. Excellent detector performance and high electron mobility makes the reported InP material promising to be used for the detection of X-rays and gamma-radiation.
  • Keywords
    III-V semiconductors; X-ray detection; alpha-particle spectroscopy; annealing; crystal growth from melt; electron mobility; gamma-ray detection; indium compounds; radioactive sources; semiconductor counters; semiconductor doping; titanium; zinc; 241Am radioactive source; Czochralski technique; InP:Ti,Zn; X-ray detection; Zn acceptors; alpha-particle spectra; annealing; charge collection efficiency; codoped semiinsulating detectors; electron mobility; gamma-radiation detection; particle detectors; semiconductor compound; shallow donors; temperature 230 K; temperature 293 K to 298 K; Atomic measurements; Crystals; Electron mobility; Gamma ray detection; Gamma ray detectors; Indium phosphide; Radiation detectors; Temperature; X-ray detection; Zinc; Gamma ray; InP; particle detector; radiation detector; semi-insulating;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2002887
  • Filename
    4696614