DocumentCode :
3559216
Title :
High Detection Performance of Particle Detectors Based on SI InP Doped With Ti and Zn
Author :
Gorodynskyy, V. ; Yatskiv, R. ; Zdansky, K. ; Pekarek, L.
Author_Institution :
Dept. of Diagnostics, Inst. of Photonics & Electron. AS CR, Prague
Volume :
55
Issue :
5
fYear :
2008
Firstpage :
2785
Lastpage :
2788
Abstract :
In this work, we present results of measurements of spectra of alpha-particles carried out on semi-insulating (SI) InP detectors. The detectors were fabricated from Ti and Zn co-doped SI InP crystals grown by Czochralski technique. Tests of detectors performance with alpha-particles emitted from 241Am (5.48 MeV) radioactive source are reported. Excellent detectors performance has been evaluated by values of charge collection efficiency 99% and energy resolution ~ 1% obtained from the spectra measured at 230 K. Such high performance can be explained by InP doping with suitable Ti atoms and co-doping with low concentration of Zn acceptors sufficient for the full compensation of shallow donors, to reach SI properties. The electron mobility of reported SI InP detectors co-doped with Ti and Zn has been found to be equal to 2510 cm2 V-1 s-1 at room temperature. This value is much higher than that obtained previously with our SI InP co-doped with Ti and Mn or with InP crystals converted to SI state by temperature annealing. Excellent detector performance and high electron mobility makes the reported InP material promising to be used for the detection of X-rays and gamma-radiation.
Keywords :
III-V semiconductors; X-ray detection; alpha-particle spectroscopy; annealing; crystal growth from melt; electron mobility; gamma-ray detection; indium compounds; radioactive sources; semiconductor counters; semiconductor doping; titanium; zinc; 241Am radioactive source; Czochralski technique; InP:Ti,Zn; X-ray detection; Zn acceptors; alpha-particle spectra; annealing; charge collection efficiency; codoped semiinsulating detectors; electron mobility; gamma-radiation detection; particle detectors; semiconductor compound; shallow donors; temperature 230 K; temperature 293 K to 298 K; Atomic measurements; Crystals; Electron mobility; Gamma ray detection; Gamma ray detectors; Indium phosphide; Radiation detectors; Temperature; X-ray detection; Zinc; Gamma ray; InP; particle detector; radiation detector; semi-insulating;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2002887
Filename :
4696614
Link To Document :
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