• DocumentCode
    3559220
  • Title

    Pulsed Bias Voltage Shutdown to Suppress the Polarization Effect for a CdTe Radiation Detector

  • Author

    Seino, Tomoyuki ; Kominami, Shinya ; Ueno, Yuichiro ; Amemiya, Kensuke

  • Author_Institution
    Central Res. Lab., Hitachi, Ltd., Kokubunji
  • Volume
    55
  • Issue
    5
  • fYear
    2008
  • Firstpage
    2770
  • Lastpage
    2774
  • Abstract
    Pulsed bias shutdown operation, in which the bias voltage supply is periodically shut down for a certain time, is suitable for suppressing the polarization effect in a CdTe radiation detector. The duration of the bias voltage shutdown should be short to decrease the dead time and ensure the continuity of the measurement; however, the polarization effect may not be suppressed if the duration is too short. Therefore, we investigated bias voltage shutdown durations and intervals that stabilize the detector performance. A stacked type detector consisting of four 1-mm-thick CdTe diodes was used. At 35degC, the energy resolution for the 511 keV photopeak of the 22 Na source saturates at around 30 min after the measurement start and then does not change up to 300 min when the bias voltage is shut down for 10 ms every 5 min. Similarly at 60degC, the energy resolution for the 511 keV photopeak is unchanged for 300 min when the bias voltage is shut down for 10 ms every 10 s.
  • Keywords
    II-VI semiconductors; gamma-ray detection; nuclear electronics; polarisation; semiconductor counters; semiconductor diodes; 22 Na source; CdTe radiation detector; dead time; electron volt energy 511 keV; energy resolution; gamma-rays detection; nuclear electronics; photopeak; polarization effect; pulsed bias voltage shutdown; semiconductor diodes; size 1 mm; stacked type detector; temperature 35 C; temperature 60 C; time 10 ms; time 10 s; time 300 min; Energy measurement; Energy resolution; Polarization; Positron emission tomography; Radiation detectors; Semiconductor diodes; Semiconductor radiation detectors; Temperature; Time measurement; Voltage; Energy resolution; polarization effect; pulsed bias voltage; semiconductor radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2002079
  • Filename
    4696618