DocumentCode :
3559289
Title :
Design and test for reliability and efficiency
Author :
Cheng, Tim
Volume :
25
Issue :
6
fYear :
2008
Firstpage :
508
Lastpage :
508
Keywords :
Circuit testing; Design methodology; Field programmable gate arrays; Information security; Nanoscale devices; Network-on-a-chip; Semiconductor device reliability; Semiconductor device testing; Switches; System testing;
fLanguage :
English
Journal_Title :
Design Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.163
Filename :
4702873
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3559289
