Title :
Clarifying the record on testability cost functions
Author :
Breuer, Melvin A.
Author_Institution :
Univ. of Southern California, Los Angeles, CA
Abstract :
Many articles have been written on testability cost functions and measures. Most of them point to the work of Lawrence Goldstein as one of the first major contributions in this field.4 In this column, the author describes his personal familiarity with some of this early work in an effort to clarify the genesis of these ideas.
Keywords :
automatic test pattern generation; logic gates; logic testing; AND gate; D-algorithm; automatic test pattern generation; testability cost functions; Aircraft; Automatic test pattern generation; Circuit faults; Controllability; Cost function; Flip-flops; Military computing; Testing; Tree data structures; Writing;
Journal_Title :
Design Test of Computers, IEEE
DOI :
10.1109/MDT.2008.161
