Title :
Raising energy transfer in corridors constrained by voltage instability-Statnett case
Author :
Quaintance, W.H. ; Uhlen, K. ; Julian, D.E. ; Gjerde, J.O. ; Vu, K.T. ; Vormedal, L.K.
Author_Institution :
Technol. Inst., ABB Electr. Syst., USA
Abstract :
Statnett SF (The Norwegian Power Grid Company) is seeking new technologies to raise their grid energy transfer limits. One technology ABB is developing utilizes local measurements to assess proximity to voltage collapse. Statnett has conducted a joint computer simulation study with ABB and SINTEF Energy Research. A frequent problem for the Nordic power market is the limited power transfer capability to Sweden along the Hasle corridor. This limit caused a negative economic impact of approximately NOK 27M or USD 3.5M in the first 8 months of 1999. Power transfer corridor limits are usually determined prior to operation, and thus the limits may be set conservatively because of insufficient knowledge of the actual operating conditions, e.g. regarding proximity to voltage collapse. When using an advanced online sensor, the true transfer limit may show to be much greater than the existing conservative limit. When linked with dedicated system protection schemes, such as load shedding in the Oslo area, this sensor can raise the limit even further by quickly shedding load in the event of a contingency
Keywords :
load flow; load shedding; power system dynamic stability; power system measurement; power system protection; power system security; Norwegian Power Grid Company; Statnett SF; advanced online sensor; energy transfer improvement; grid energy transfer limits; load shedding; local measurements; power systems; power transfer corridor limits; system protection schemes; voltage collapse proximity assessment; voltage instability; Computer aided software engineering; Computer simulation; Energy exchange; Power generation economics; Power grids; Power markets; Power system security; Power system stability; Senior members; Voltage control;
Conference_Titel :
Power Engineering Society Summer Meeting, 2000. IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-6420-1
DOI :
10.1109/PESS.2000.866957