• DocumentCode
    3559441
  • Title

    Sampling and Reconstruction of Piecewise Constant Signals by Parallel CR-Network

  • Author

    Olkkonen, Juuso T. ; Olkkonen, Hannu

  • Author_Institution
    VTT Tech. Res. Centre of Finland, Espoo
  • Volume
    55
  • Issue
    11
  • fYear
    2008
  • Firstpage
    1159
  • Lastpage
    1162
  • Abstract
    Piecewise constant (PWC) waveforms consisting of amplitude-modulated edges (AMEs) are an important signal family in optical communication technology. The sampling of PWC signals by an analog-to-digital converter (ADC) requires an extremely high sampling rate. In this paper, we show that PWC signals can be measured and reconstructed using a parallel capacitor-resistor network (PCRN). The reconstruction of the amplitudes and arrival times of p AMEs occurring during one sampling period is possible using 2 p parallel CR-filters whose outputs are simultaneously sampled. The PCRN significantly reduces the sampling rate of the ADC, and the reconstruction algorithm is manageable on microprocessor and very large scale integration circuits. We describe several variations and applications of the PCRN sampling scheme.
  • Keywords
    VLSI; amplitude modulation; analogue-digital conversion; digital signal processing chips; microprocessor chips; optical fibre communication; piecewise constant techniques; signal sampling; 2p parallel CR filters; PCRN sampling scheme; PWC signal sampling; PWC waveforms; VLSI; amplitude-modulated edges; analog-to-digital converter; microprocessor; optical communication technology; parallel C-R network; parallel capacitor-resistor network; piecewise constant signals; reconstruction algorithm; sampling period; very large scale integration circuits; Analog-digital conversion; Chromium; Circuits; Communications technology; Microprocessors; Optical fiber communication; Reconstruction algorithms; Sampling methods; Ultraviolet sources; Very large scale integration; Analog-to-digital converters (ADCs); microprocessors; piecewise constant (PWC) signals; very large scale integration (VLSI);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2008.2002568
  • Filename
    4703527