• DocumentCode
    3559514
  • Title

    New Electron-Waveguide-Based Modeling for Carbon Nanotube Interconnects

  • Author

    Sarto, Maria Sabrina ; Tamburrano, Alessio ; Amore, Marcello D.

  • Author_Institution
    Res. Center on Nanotechnol. Appl. to Eng. of Sapienza, Sapienza Univ. of Rome, Rome
  • Volume
    8
  • Issue
    2
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    214
  • Lastpage
    225
  • Abstract
    In this paper, hybrid transmission line-quantum mechanical models are proposed for the analysis of the signal propagation along metallic and quasi-metallic single-wall carbon nanotube (SWCNT) and bundles of SWCNTs. The analysis is based on the general assumption that the SWCNT is characterized by n energy subbands crossing the Fermi level. The proposed model is derived from a new development of the electron waveguide formalism in time and frequency domains, taking into account the damping effect produced by electron scattering. Simulation results are compared with experimental measurements available in literature in order to validate the developed models. Numerical calculations are performed in order to predict the current carrying capability of SWCNT interconnects having different configurations in the low-voltage bias hypothesis. Comparison with the performances of scaled copper interconnects is also presented.
  • Keywords
    Fermi level; carbon nanotubes; integrated circuit interconnections; nanotechnology; C; Fermi level; carbon nanotube interconnects; damping effect; electron waveguide formalism; electron-waveguide-based modeling; hybrid transmission line-quantum mechanical models; low-voltage bias hypothesis; quasimetallic single-wall carbon nanotube; Nanointerconnect; signal propagation; single-wall carbon nanotube (SWCNT); transmission line (TL);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    12/12/2008 12:00:00 AM
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.2010253
  • Filename
    4711093