• DocumentCode
    3559529
  • Title

    SPICE Optimization of Organic FET Models Using Charge Transport Elements

  • Author

    Vaidya, Vaibhav ; Kim, Jungbae ; Haddock, Joshua N. ; Kippelen, Bernard ; Wilson, Denise

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
  • Volume
    56
  • Issue
    1
  • fYear
    2009
  • Firstpage
    38
  • Lastpage
    42
  • Abstract
    We report on a modeling technique that uses charge transport equations to calculate channel current in organic field effect transistors (OFETs) by numerical solution in the SPICE simulation program. SPICE is also used to optimize the model and achieve a fit to measured characteristics within 5% error. The overall modeling technique is a bridge between physical models of charge transport and a SPICE model useful in circuit simulation without requiring a closed-form drain-current equation. The automatic optimization of the simulation to measured curves will also allow, in the future, the empirical weighing of various charge transport effects in search of physical device operation, given sufficient empirical data. This modeling technique was applied to the measured characteristics of an OFET using pentacene in which the mobility was dependent on the voltage in the channel. The accuracy of the fit was better than 5% for 40 V > VDS > 7V and better than 20% for VDS > 7V. Simulation was completed within 3 min for this optimization on a modern personal computer.
  • Keywords
    field effect transistors; organic compounds; semiconductor device models; SPICE optimization; SPICE simulation program; charge transport effects; charge transport elements; closed-form drain-current equation; mobility; organic FET models; organic field effect transistors; pentacene; Bridge circuits; Charge measurement; Circuit simulation; Current measurement; Equations; FETs; OFETs; Pentacene; SPICE; Voltage; Charge transport; OTFT; SPICE; SPICE optimization; organic electronics; organic field effect transistor (OFET);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    12/12/2008 12:00:00 AM
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2008164
  • Filename
    4711108