DocumentCode
3559529
Title
SPICE Optimization of Organic FET Models Using Charge Transport Elements
Author
Vaidya, Vaibhav ; Kim, Jungbae ; Haddock, Joshua N. ; Kippelen, Bernard ; Wilson, Denise
Author_Institution
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
Volume
56
Issue
1
fYear
2009
Firstpage
38
Lastpage
42
Abstract
We report on a modeling technique that uses charge transport equations to calculate channel current in organic field effect transistors (OFETs) by numerical solution in the SPICE simulation program. SPICE is also used to optimize the model and achieve a fit to measured characteristics within 5% error. The overall modeling technique is a bridge between physical models of charge transport and a SPICE model useful in circuit simulation without requiring a closed-form drain-current equation. The automatic optimization of the simulation to measured curves will also allow, in the future, the empirical weighing of various charge transport effects in search of physical device operation, given sufficient empirical data. This modeling technique was applied to the measured characteristics of an OFET using pentacene in which the mobility was dependent on the voltage in the channel. The accuracy of the fit was better than 5% for 40 V > VDS > 7V and better than 20% for VDS > 7V. Simulation was completed within 3 min for this optimization on a modern personal computer.
Keywords
field effect transistors; organic compounds; semiconductor device models; SPICE optimization; SPICE simulation program; charge transport effects; charge transport elements; closed-form drain-current equation; mobility; organic FET models; organic field effect transistors; pentacene; Bridge circuits; Charge measurement; Circuit simulation; Current measurement; Equations; FETs; OFETs; Pentacene; SPICE; Voltage; Charge transport; OTFT; SPICE; SPICE optimization; organic electronics; organic field effect transistor (OFET);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
Conference_Location
12/12/2008 12:00:00 AM
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2008.2008164
Filename
4711108
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