Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell

Author

Kang, No-Weon ; Kang, Jin-Seob ; Kim, Dae-Chan ; Kim, Jeong-Hwan ; Lee, Joo-Gwang

Author_Institution

Electromagn. Metrol. Center, Korea Res. Inst. of Stand. & Sci., Daejeon

Volume

58

Issue

4

fYear

2009

fDate

4/1/2009 12:00:00 AM

Firstpage

1109

Lastpage

1113

Abstract

In this paper, we introduce a simple and wideband characterization method for electric field probes using a transfer standard. As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell. A gigahertz transverse electromagnetic (GTEM) cell is used to generate a reference electric field. It has been shown that the uncertainty of the proposed method can be increased due to the imperfection of the field condition in the cell. According to the measurement result, the proposed characterization method for the electric probes agrees within 6.3%, compared with the method that uses the TEM cell and standard antennas in a fully anechoic chamber.

Keywords

anechoic chambers (electromagnetic); electric fields; electromagnetic compatibility; probes; GTEM cell; TEM cell; anechoic chamber; disk-type reference probe; electric field probes; frequency 50 MHz to 1000 MHz; microtransverse electromagnetic cell; transfer standard; wideband characterization method; Calibration; electromagnetic field; measurement standard; probe antenna; transfer standard;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

Conference_Location

12/12/2008 12:00:00 AM

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2008.2008592

Filename

4711126