DocumentCode
3559556
Title
Oscillatory Transmission Line Pulsing for Characterization of Device Transient Response
Author
Di Sarro, James P. ; Rosenbaum, Elyse
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
Volume
30
Issue
2
fYear
2009
Firstpage
168
Lastpage
170
Abstract
An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.
Keywords
electrostatic discharge; rectifying circuits; semiconductor devices; transient response; transmission lines; device transient response; electrostatic discharge protection device; large-amplitude radio-frequency damped sinusoid; oscillatory transmission line pulse generation system; silicon-controlled rectifier; trigger voltage; Electrostatic discharge (ESD); silicon-controlled rectifier (SCR); transmission line pulsing (TLP);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
Conference_Location
12/12/2008 12:00:00 AM
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.2009361
Filename
4711135
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