• DocumentCode
    3559588
  • Title

    Decoding algorithm and architecture for BCH codes under the Lee Metric

  • Author

    Wu, Yingquan ; Hadjicostis, Christoforos N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana- Champaign, Champaign, IL
  • Volume
    56
  • Issue
    12
  • fYear
    2008
  • fDate
    12/1/2008 12:00:00 AM
  • Firstpage
    2050
  • Lastpage
    2059
  • Abstract
    The Lee metric measures the circular distance between two elements in a cyclic group and is particularly appropriate as a measure of distance for data transmission under phase-shift-keying modulation over a white noise channel. In this paper, using newly derived properties on Newton´s identities, we initially investigate the Lee distance properties of a class of BCH codes and show that (for an appropriate range of parameters) their minimum Lee distance is at least twice their designed Hamming distance. We then make use of properties of these codes to devise an efficient algebraic decoding algorithm that successfully decodes within the above lower bound of the Lee error-correction capability. Finally, we propose an attractive design for the corresponding VLSI architecture that is only mildly more complex than popular decoder architectures under the Hamming metric; since the proposed architecture can also be used for decoding under the Hamming metric without extra hardware, one can use the proposed architecture to decode under both distance metrics (Lee and Hamming).
  • Keywords
    AWGN; BCH codes; Hamming codes; VLSI; algebraic codes; data communication; decoding; error correction codes; phase shift keying; BCH code; Hamming distance; Lee metric; Newton identities; VLSI architecture; algebraic decoding algorithm; data transmission; decoding algorithm; decoding architecture; error-correction capability; minimum Lee distance; phase-shift-keying modulation; white noise channel; Data communication; Decoding; Hamming distance; Noise measurement; Particle measurements; Phase measurement; Phase modulation; Phase shift keying; Very large scale integration; White noise;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    12/1/2008 12:00:00 AM
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/TCOMM.2008.041227
  • Filename
    4711169