• DocumentCode
    3559692
  • Title

    Characterization of Nanomagnet Fringing Fields in Hybrid Semiconductor/Ferromagnetic Devices

  • Author

    Bae, J.-U. ; Lin, T.-Y. ; Yoon, Y. ; Kim, S.J. ; Bird, J.P. ; Imre, A. ; Porod, W. ; Reno, J.L.

  • Author_Institution
    Dept. of Electr. Eng., State Univ. of New York at Buffalo, Buffalo, NY
  • Volume
    44
  • Issue
    12
  • fYear
    2008
  • Firstpage
    4706
  • Lastpage
    4710
  • Abstract
    We describe the fabrication of a hybrid nanomagneto-electronic device, consisting of a GaAs/AlGaAs quantum wire that is bridged by a ferromagnetic gate, and study the influence of the nanomagnet fringing fields on the quantum-wire magneto-resistance. The nonplanar gate shows clear single-domain structure in magnetic-force microscopy, and a simple magnetization behavior in an external magnetic field. This behavior is reflected as a hysteretic variation of the quantum-wire magneto-resistance, whose magnitude is found to be consistent with theoretical predictions for ballistic electron transport through a spatially varying magnetic field.
  • Keywords
    III-V semiconductors; aluminium compounds; ballistic transport; gallium arsenide; magnetic force microscopy; magnetoelectronics; magnetoresistive devices; semiconductor quantum wires; GaAs-AlGaAs; ballistic electron; hybrid nanomagneto-electronic device; hybrid semiconductor/ferromagnetic devices; magnetic-force microscopy; nanomagnet fringing fields; quantum wire; Ferromagnet; hysteresis; magneto-electronics; magneto-resistance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2002924
  • Filename
    4711286