DocumentCode :
3559692
Title :
Characterization of Nanomagnet Fringing Fields in Hybrid Semiconductor/Ferromagnetic Devices
Author :
Bae, J.-U. ; Lin, T.-Y. ; Yoon, Y. ; Kim, S.J. ; Bird, J.P. ; Imre, A. ; Porod, W. ; Reno, J.L.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York at Buffalo, Buffalo, NY
Volume :
44
Issue :
12
fYear :
2008
Firstpage :
4706
Lastpage :
4710
Abstract :
We describe the fabrication of a hybrid nanomagneto-electronic device, consisting of a GaAs/AlGaAs quantum wire that is bridged by a ferromagnetic gate, and study the influence of the nanomagnet fringing fields on the quantum-wire magneto-resistance. The nonplanar gate shows clear single-domain structure in magnetic-force microscopy, and a simple magnetization behavior in an external magnetic field. This behavior is reflected as a hysteretic variation of the quantum-wire magneto-resistance, whose magnitude is found to be consistent with theoretical predictions for ballistic electron transport through a spatially varying magnetic field.
Keywords :
III-V semiconductors; aluminium compounds; ballistic transport; gallium arsenide; magnetic force microscopy; magnetoelectronics; magnetoresistive devices; semiconductor quantum wires; GaAs-AlGaAs; ballistic electron; hybrid nanomagneto-electronic device; hybrid semiconductor/ferromagnetic devices; magnetic-force microscopy; nanomagnet fringing fields; quantum wire; Ferromagnet; hysteresis; magneto-electronics; magneto-resistance;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2008.2002924
Filename :
4711286
Link To Document :
بازگشت