DocumentCode :
3560051
Title :
Excellent Low Loss Performance of Microwave Permeability in High Resistive CoFeHfO Films by Thermal Annealing
Author :
Kim, Dong Young ; Yoon, Seok Soo ; Rao, B. Parvatheeswara ; Kim, CheolGi ; Kim, Ki Hyeon ; Takahashi, M.
Author_Institution :
Dept. of Phys., Andong Nat. Univ., Andong
Volume :
44
Issue :
11
fYear :
2008
Firstpage :
3115
Lastpage :
3118
Abstract :
This paper reports on the thermal field annealing effect of microwave permeabilities in CoFeHfO thin films. For the high resistive optimized Co19Fe53Hf8O20 thin films annealed at 150deg C, apart from excellent magnetic performance very low Gilbert damping constants (alpha < 0.017) are obtained up to film thickness of 437 nm. The results are interpreted in terms of changes in microstructure leading to structural relaxation effect and evolution of nanocrystalline Co(Fe) precipitates out of thermal field annealing. These materials with excellent low loss performance are obviously the most promising candidates for microwave device applications.
Keywords :
annealing; cobalt compounds; damping; insulating thin films; iron compounds; nanostructured materials; permeability; precipitation; Co19Fe53Hf8O20; Gilbert damping constants; high resistive films; microstructure; microwave device applications; microwave permeability; nanocrystals; precipitation; structural relaxation effect; temperature 150 C; thermal annealing; Amorphous; CoFeHfO; low loss; microwave permeability;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2008.2001627
Filename :
4717385
Link To Document :
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