DocumentCode
3560396
Title
Magnetoresistance in Co/ZnO Films
Author
Li, Xiao-Li ; Quan, Zhi-Yong ; Xu, Xiao-Hong ; Wu, Hai-Shun ; Gehring, G.A.
Author_Institution
Sch. of Chem. & Mater. Sci., Shanxi Normal Univ., Linfen
Volume
44
Issue
11
fYear
2008
Firstpage
2684
Lastpage
2687
Abstract
[Co(0.6 nm)/ZnO( x nm)] 60 (x=0.3 - 3) films were deposited on glass substrates by magnetron sputtering, and then annealed in vacuum. The large negative magnetoresistance of -10.4% is observed in the as-deposited [Co(0.6 nm)/ZnO(0.4 nm)] 60 film. When ZnO layer thickness is increased from 0.3 to 3 nm, MR ratios of the as-deposited Co/ZnO films are gradually decreased and MR ratios of the annealed films are increased, which might be attributed to the transformation of the structures from the multilayers to granular films during annealing. And the postannealing process makes the magnetism of the films transform from superparamagnetism to ferromagnetism due to Co precipitation in granular films after annealing.
Keywords
annealing; cobalt; ferromagnetic materials; giant magnetoresistance; magnetic thin films; sputter deposition; superparamagnetism; zinc compounds; Co-ZnO; annealing; ferromagnetism; large negative magnetoresistance; magnetron sputtering; multilayers; precipitation; superparamagnetism; Annealing; magnetic semiconductor; magnetoresistance (MR); sputtering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2008.2003238
Filename
4717761
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