• DocumentCode
    3560396
  • Title

    Magnetoresistance in Co/ZnO Films

  • Author

    Li, Xiao-Li ; Quan, Zhi-Yong ; Xu, Xiao-Hong ; Wu, Hai-Shun ; Gehring, G.A.

  • Author_Institution
    Sch. of Chem. & Mater. Sci., Shanxi Normal Univ., Linfen
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    2684
  • Lastpage
    2687
  • Abstract
    [Co(0.6 nm)/ZnO( x nm)] 60 (x=0.3 - 3) films were deposited on glass substrates by magnetron sputtering, and then annealed in vacuum. The large negative magnetoresistance of -10.4% is observed in the as-deposited [Co(0.6 nm)/ZnO(0.4 nm)] 60 film. When ZnO layer thickness is increased from 0.3 to 3 nm, MR ratios of the as-deposited Co/ZnO films are gradually decreased and MR ratios of the annealed films are increased, which might be attributed to the transformation of the structures from the multilayers to granular films during annealing. And the postannealing process makes the magnetism of the films transform from superparamagnetism to ferromagnetism due to Co precipitation in granular films after annealing.
  • Keywords
    annealing; cobalt; ferromagnetic materials; giant magnetoresistance; magnetic thin films; sputter deposition; superparamagnetism; zinc compounds; Co-ZnO; annealing; ferromagnetism; large negative magnetoresistance; magnetron sputtering; multilayers; precipitation; superparamagnetism; Annealing; magnetic semiconductor; magnetoresistance (MR); sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2003238
  • Filename
    4717761