DocumentCode :
3560442
Title :
Reliability Evaluation of Piezoelectric Micro-Actuators With Application in Hard Disk Drives
Author :
He, Zhimin ; Loh, Han Tong ; Ong, Eng Hong
Author_Institution :
Data Storage Inst., Mechatron. & Recording Channels Div., A*Star, Singapore
Volume :
44
Issue :
11
fYear :
2008
Firstpage :
3722
Lastpage :
3725
Abstract :
Piezoelectric micro-actuators have been extensively studied and used in hard disk drive head positioning systems. In these cases, piezoelectric micro-actuators/sensors experience high frequency cyclic loading during their operations. The fatigue failure and the lifespan of such micro-actuators become a concern of researchers and engineers. However, the probability and statistics based reliability theory has not been well developed for piezoelectric micro actuators. In this paper, a probabilistic approach is presented to evaluate the reliability of piezoelectric micro-actuators. Based on the relationship between the lifetime degradation mechanism of piezoelectric actuators and the electric field strength, an interference model of electric load and strength is introduced for the reliability study of piezoelectric micro-actuators. Furthermore the reliability model is expanded into a 2-D case to take into account the effects of both driving voltage and temperature. A 2-D interference model incorporating the 2-D strength and load is proposed to obtain the relationship among the reliability, usage cycles, driving voltage and temperature. A case study of a piezoelectric micro-actuator used in a disk drive head positioning system demonstrates the application of the proposed approach.
Keywords :
disc drives; fatigue; hard discs; interference; magnetic heads; microactuators; micropositioning; piezoelectric actuators; reliability theory; electric field strength; electric load interference model; electric strength interference model; fatigue failure; hard disk drive head positioning systems; lifetime degradation; piezoelectric micro-actuators; probability; reliability theory; statistics; 2-D strength; Electric strength; fatigue life; piezoelectric micro-actuators; probability distribution; reliability; temperature;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2008.2002619
Filename :
4717811
Link To Document :
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