• DocumentCode
    3560531
  • Title

    Laser Scribing of Sapphire Substrate to Increase Side Light Extraction of GaN-Based Light Emitting Diodes

  • Author

    Chen, K.C. ; Su, Y.K. ; Lin, Chun-Liang ; Hsu, H.C.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    29
  • Issue
    13
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    1907
  • Lastpage
    1912
  • Abstract
    Generally, the laser scribing was done after GaN-based light emitting diodes (LEDs) growth. This study verified that the utilization of laser scribing leads to an increase in the surface roughness of sapphire substrate sidewalls, which reduces the probability of total internal reflection from light striking the sapphire/air interface. Laser scribing also helps increase side light extraction intensity and output power of GaN-based light emitting diodes. Study results indicated that lasers create a laser scribing layer (LSL) at a depth of approximately 30 μ m after GaN-based LEDs grown in the sapphire substrate undergo laser scribing. Scanning electron microscopy was used to observe the rough surface of the LSL, while near-field optical images verified that rough surface LSL contributes to an increase in side wall light extraction intensity of LEDs. Furthermore, changing the depth of focus of the laser beam (from 0 μm to 36 μm) allows the formation of a large quantity of 3 to 5 μm holes on the LSL. Measurement results indicated that these holes caused the LSL surface to be even rougher, which further strengthened LED side wall light extraction intensity. The results after packaging show that LSL with holes increase output power at 20 mA of GaN-based LEDs by approximately 12.2 %.
  • Keywords
    III-V semiconductors; gallium compounds; laser materials processing; light emitting diodes; sapphire; surface roughness; surface treatment; wide band gap semiconductors; Al2O3; GaN; laser scribing; light emitting diodes; rough surface; sapphire substrate; side light extraction; surface roughness; total internal reflection; Gallium nitride; Light emitting diodes; Rough surfaces; Substrates; Surface emitting lasers; Surface morphology; Surface roughness; GaN-based light emitting diodes; laser scribing; rough surfaces; sapphire substrate; side light extraction intensity;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • Conference_Location
    4/21/2011 12:00:00 AM
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2011.2140091
  • Filename
    5753902