DocumentCode
3560531
Title
Laser Scribing of Sapphire Substrate to Increase Side Light Extraction of GaN-Based Light Emitting Diodes
Author
Chen, K.C. ; Su, Y.K. ; Lin, Chun-Liang ; Hsu, H.C.
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
29
Issue
13
fYear
2011
fDate
7/1/2011 12:00:00 AM
Firstpage
1907
Lastpage
1912
Abstract
Generally, the laser scribing was done after GaN-based light emitting diodes (LEDs) growth. This study verified that the utilization of laser scribing leads to an increase in the surface roughness of sapphire substrate sidewalls, which reduces the probability of total internal reflection from light striking the sapphire/air interface. Laser scribing also helps increase side light extraction intensity and output power of GaN-based light emitting diodes. Study results indicated that lasers create a laser scribing layer (LSL) at a depth of approximately 30 μ m after GaN-based LEDs grown in the sapphire substrate undergo laser scribing. Scanning electron microscopy was used to observe the rough surface of the LSL, while near-field optical images verified that rough surface LSL contributes to an increase in side wall light extraction intensity of LEDs. Furthermore, changing the depth of focus of the laser beam (from 0 μm to 36 μm) allows the formation of a large quantity of 3 to 5 μm holes on the LSL. Measurement results indicated that these holes caused the LSL surface to be even rougher, which further strengthened LED side wall light extraction intensity. The results after packaging show that LSL with holes increase output power at 20 mA of GaN-based LEDs by approximately 12.2 %.
Keywords
III-V semiconductors; gallium compounds; laser materials processing; light emitting diodes; sapphire; surface roughness; surface treatment; wide band gap semiconductors; Al2O3; GaN; laser scribing; light emitting diodes; rough surface; sapphire substrate; side light extraction; surface roughness; total internal reflection; Gallium nitride; Light emitting diodes; Rough surfaces; Substrates; Surface emitting lasers; Surface morphology; Surface roughness; GaN-based light emitting diodes; laser scribing; rough surfaces; sapphire substrate; side light extraction intensity;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
Conference_Location
4/21/2011 12:00:00 AM
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2011.2140091
Filename
5753902
Link To Document