DocumentCode :
3560773
Title :
Reliability in Layered Networks With Random Link Failures
Author :
Lee, Kayi ; Lee, Hyang-Won ; Modiano, Eytan
Volume :
19
Issue :
6
fYear :
2011
Firstpage :
1835
Lastpage :
1848
Abstract :
We consider network reliability in layered networks where the lower layer experiences random link failures. In layered networks, each failure at the lower layer may lead to multiple failures at the upper layer. We generalize the classical polynomial expression for network reliability to the multilayer setting. Using random sampling techniques, we develop polynomial-time approximation algorithms for the failure polynomial. Our approach gives an approximate expression for reliability as a function of the link failure probability, eliminating the need to resample for different values of the failure probability. Furthermore, it gives insight on how the routings of the logical topology on the physical topology impact network reliability. We show that maximizing the min cut of the (layered) network maximizes reliability in the low-failure-probability regime. Based on this observation, we develop algorithms for routing the logical topology to maximize reliability.
Keywords :
polynomial approximation; probability; sampling methods; telecommunication network reliability; telecommunication network routing; telecommunication network topology; failure polynomial; layered network reliability; link failure probability; logical topology; network routings; physical topology; polynomial expression; polynomial-time approximation algorithm; random link failures; random sampling technique; Computer network reliability; Monte Carlo methods; Nonhomogeneous media; Polynomials; Reliability; Topology; Lightpath routing; multilayer network; network reliability; random failures; random sampling; reliability approximation;
fLanguage :
English
Journal_Title :
Networking, IEEE/ACM Transactions on
Publisher :
ieee
Conference_Location :
4/29/2011 12:00:00 AM
ISSN :
1063-6692
Type :
jour
DOI :
10.1109/TNET.2011.2143425
Filename :
5759108
Link To Document :
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