• DocumentCode
    3561015
  • Title

    Design Exploration of Hybrid CMOS and Memristor Circuit by New Modified Nodal Analysis

  • Author

    Fei, Wei ; Yu, Hao ; Zhang, Wei ; Yeo, Kiat Seng

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    20
  • Issue
    6
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    1012
  • Lastpage
    1025
  • Abstract
    Design of hybrid circuits and systems based on CMOS and nano-device requires rethinking of fundamental circuit analysis to aid design exploration. Conventional circuit analysis with modified nodal analysis (MNA) cannot consider new nano-devices such as memristor together with the traditional CMOS devices. This paper has introduced a new MNA method with magnetic flux (Φ) as new state variable. New SPICE-like circuit simulator is thereby developed for the design of hybrid CMOS and memristor circuits. A number of CMOS and memristor-based designs are explored, such as oscillator, chaotic circuit, programmable logic, analog-learning circuit, and crossbar memory, where their functionality, performance, reliability and power can be efficiently verified by the newly developed simulator. Specifically, one new 3-D-crossbar architecture with diode-added memristor is also proposed to improve integration density and to avoid sneak path during read-write operation.
  • Keywords
    CMOS integrated circuits; SPICE; chaos; circuit simulation; magnetic flux; memristors; nanoelectronics; oscillators; reliability; 3D-crossbar architecture; CMOS; MNA; SPICE-like circuit simulator; analog-learning circuit; chaotic circuit; crossbar memory; diode-added memristor; integration density; magnetic flux; memristor circuit; modified nodal analysis; nanodevice; oscillator; programmable logic; reliability; CMOS integrated circuits; Equations; Integrated circuit modeling; Magnetic circuits; Magnetic hysteresis; Mathematical model; Memristors; 3-D crossbar memory; memristor; nano-scale circuit simulation;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    5/5/2011 12:00:00 AM
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2011.2136443
  • Filename
    5762650