Title :
High frequency eigenanalysis of HVDC and FACTS assisted power systems
Author :
Pilotto, L.A.S. ; Alves, J.E.R. ; Watanabe, E.H.
Author_Institution :
Centro de Pesquisas de Energia Eletrica, Rio de Janeiro, Brazil
Abstract :
Conventional transient stability or eigenvalue programs can not be used for investigating high frequency control interaction phenomena on HVDC and/or FACTS assisted power systems. In these programs the network is modeled by algebraic equations and therefore only the fundamental frequency phasor behavior of the system is represented. Higher frequency interactions are not captured by this type of analysis and completely fail to help engineers to correctly design power electronics based controllers to avoid high frequency unstable situations. This paper presents a comprehensive approach for investigating the high frequency dynamic response of both HVDC and FACTS controllers. The adopted method is bared on the application of generalized switching functions. The second harmonic instability problem in HVDC systems is investigated using the proposed methodology
Keywords :
HVDC power convertors; HVDC power transmission; dynamic response; eigenvalues and eigenfunctions; flexible AC transmission systems; frequency control; frequency response; power system harmonics; power system transient stability; power transmission control; switching; FACTS assisted power systems; FACTS controllers; HVDC assisted power system; HVDC controllers; algebraic equations; eigenvalue programs; fundamental frequency phasor behavior; generalized switching functions; high frequency control interaction phenomena; high frequency dynamic response; high frequency eigenanalysis; power electronics based controllers; second harmonic instability; transient stability; Eigenvalues and eigenfunctions; Equations; Frequency control; HVDC transmission; Power system analysis computing; Power system control; Power system modeling; Power system stability; Power system transients; Power systems;
Conference_Titel :
Power Engineering Society Summer Meeting, 2000. IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-6420-1
DOI :
10.1109/PESS.2000.867460
