• DocumentCode
    3561346
  • Title

    Constrained Empirical Risk Minimization Framework for Distance Metric Learning

  • Author

    Wei Bian ; Dacheng Tao

  • Author_Institution
    Center for Quantum Comput. & Intell. Syst., Univ. of Technol., Sydney, NSW, Australia
  • Volume
    23
  • Issue
    8
  • fYear
    2012
  • Firstpage
    1194
  • Lastpage
    1205
  • Abstract
    Distance metric learning (DML) has received increasing attention in recent years. In this paper, we propose a constrained empirical risk minimization framework for DML. This framework enriches the state-of-the-art studies on both theoretic and algorithmic aspects. Theoretically, we comprehensively analyze the generalization by bounding the sample and the approximation errors with respect to the best model. Algorithmically, we carefully derive an optimal gradient descent by using Nesterov´s method, and provide two example algorithms that utilize the logarithmic loss and the smoothed hinge loss, respectively. We evaluate the new framework on data classification and image retrieval experiments. Results show that the new framework has competitive performance compared with the representative DML algorithms, including Xing´s method, large margin nearest neighbor classifier, neighborhood component analysis, and regularized metric learning.
  • Keywords
    approximation theory; data analysis; gradient methods; image retrieval; learning (artificial intelligence); pattern classification; risk management; DML algorithms; Nesterov method; Xing method; approximation errors; constrained empirical risk minimization framework; data classification; distance metric learning; image retrieval experiments; large margin nearest neighbor classifier; logarithmic loss utilization; neighborhood component analysis; optimal gradient descent; regularized metric learning; smoothed hinge loss; Algorithm design and analysis; Approximation algorithms; Approximation error; Image retrieval; Probabilistic logic; Risk management; Upper bound; Data classification; distance metric learning; empirical risk minimization; first-order method; generalization; image retrieval; optimal convergence rate;
  • fLanguage
    English
  • Journal_Title
    Neural Networks and Learning Systems, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    5/22/2012 12:00:00 AM
  • ISSN
    2162-237X
  • Type

    jour

  • DOI
    10.1109/TNNLS.2012.2198075
  • Filename
    6203595