• DocumentCode
    356139
  • Title

    On automating lightning analysis methods

  • Author

    Mahseredjian, Jean ; Xémard, Alain ; Qako, Niko

  • Author_Institution
    Hydro-Quebec, Varennes, Que., Canada
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    890
  • Abstract
    Summary form only given. This paper presents a new method (LIPS) for automating lightning analysis in power systems. LIPS (Lightning Impact on Power Systems) relies on a specialized transient analysis package, such as EMTP, for computing the random nature of lightning and allowing a probabilistic insulation coordination approach to be performed, as it is recommended in IEC 60071. LIPS acts as a front-end for defining the probabilistic study, making modeling choices and submitting simulation cases. The transient analysis software acts, as a simulation server with results returned into LIPS for risk estimation. LIPS is designed for both direct and induced lightning studies. Its main approach and underlying methods are discussed. LIPS provides significant economical advantages in design and study procedures: it reduces the time required to prepare and conduct lightning studies; it provides an automated environment for retracing performed studies and related data; and it allows documentation and clarification procedures used by expert engineers
  • Keywords
    EMTP; insulation co-ordination; lightning; power system analysis computing; power systems; risk management; EMTP; IEC 60071; Lightning Impact on Power Systems; direct lightning; induced lightning; lightning analysis methods automation; probabilistic insulation coordination; risk estimation; simulation server; specialized transient analysis package; transient analysis software; Computational modeling; EMTP; Insulation; Lightning; Lips; Packaging; Power system analysis computing; Power system modeling; Power system transients; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society Summer Meeting, 2000. IEEE
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-6420-1
  • Type

    conf

  • DOI
    10.1109/PESS.2000.867478
  • Filename
    867478