DocumentCode :
3561433
Title :
Estimation of the Mathematical Parameters of Double-Exponential Pulses Using the Nelder–Mead Algorithm
Author :
Magdowski, Mathias ; Vick, Ralf
Author_Institution :
Otto-von-Guericke Univ. Magdeburg, Magdeburg, Germany
Volume :
52
Issue :
4
fYear :
2010
Firstpage :
1060
Lastpage :
1062
Abstract :
Transient pulses for electromagnetic compatibility problems, such as the high-altitude electromagnetic pulse and ultrawideband pulses, are often described by a double-exponential pulse. Such a pulse shape is specified physically by the three characteristic parameters rise time tr, pulsewidth tfwhm (full-width at half-maximum), and maximum amplitude Emax. The mathematical description is a double-exponential function with the parameters α, β, and E0. In practice, it is often necessary to transform the two groups of parameters into each other. This paper shows a novel relationship between the physical parameters tr and tfwhm on the one hand and the mathematical parameters α and β on the other. It is shown that the least-squares method in combination with the Nelder-Mead simplex algorithm is appropriate to determine an approximate closed-form formula between these parameters. Therefore, the extensive analysis of double-exponential pulses is possible in a considerably shorter computation time. The overall approximation error is less than 3.8%.
Keywords :
electromagnetic compatibility; least squares approximations; parameter estimation; Nelder-Mead algorithm; double-exponential pulses; electromagnetic compatibility; least-squares method; transient pulses; Approximation error; EMP radiation effects; Electromagnetic compatibility; Equations; Estimation error; Parameter estimation; Pulse shaping methods; Shape; Space vector pulse width modulation; Ultra wideband technology; Double-exponential pulse; Nelder–Mead; high-altitude electromagnetic pulse; parameter estimation; pulsewidth; rise time; ultrawideband pulse;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
Conference_Location :
7/8/2010 12:00:00 AM
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2010.2052621
Filename :
5504089
Link To Document :
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