• DocumentCode
    35630
  • Title

    A Low-Power Hybrid RO PUF With Improved Thermal Stability for Lightweight Applications

  • Author

    Yuan Cao ; Le Zhang ; Chip-Hong Chang ; Shoushun Chen

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    34
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    1143
  • Lastpage
    1147
  • Abstract
    Ring oscillator (RO)-based physical unclonable function (PUF) is resilient against noise impacts, but its response is susceptible to temperature variations. This paper presents a low-power and small footprint hybrid RO PUF with a very high temperature stability, which makes it an ideal candidate for lightweight applications. The negative temperature coefficient of the low-power subthreshold operation of current starved inverters is exploited to mitigate the variations of differential RO frequencies with temperature. The new architecture uses conspicuously simplified circuitries to generate and compare a large number of pairs of RO frequencies. The proposed nine-stage hybrid RO PUF was fabricated using global foundry 65-nm CMOS technology. The PUF occupies only 250 μm2 of chip area and consumes only 32.3 μW per challenge response pair at 1.2 V and 230 MHz. The measured average and worst-case reliability of its responses are 99.84% and 97.28%, respectively, over a wide range of temperature from -40 to 120 °C.
  • Keywords
    CMOS integrated circuits; low-power electronics; oscillators; thermal stability; challenge response pair; chip area; current-starved inverters; differential RO frequency; global foundry CMOS technology; improved thermal stability; lightweight application; low-power hybrid RO PUF; low-power subthreshold operation; negative temperature coefficient; nine-stage hybrid RO PUF; noise impacts; power 32.3 muW; ring oscillator-based physical unclonable function; temperature -40 degC to 120 degC; temperature stability; temperature variation; Inverters; Radiation detectors; Semiconductor device measurement; Temperature measurement; Thermal stability; Transistors; Hardware security; Physical Unclonable Function; hardware security; physical unclonable function (PUF); process variation; ring oscillator; ring oscillator (RO); temperature stability;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2015.2424955
  • Filename
    7090974