• DocumentCode
    3564438
  • Title

    Guided execution of hybrid similarity-measures for registration of partially overlapped aerial imagery

  • Author

    Vakil, Mohammad I. ; Malas, John A. ; Megherbi, Dalila B.

  • Author_Institution
    Sensors Directorate, Air Force Res. Lab., Wright-Patterson AFB, OH, USA
  • fYear
    2014
  • Firstpage
    63
  • Lastpage
    68
  • Abstract
    This work presents a two-phase image registration technique utilizing a hybrid feature-based and an area-based similarity measure of partially overlapped aerial imagery in presence of affine translation and rotation transformations. The resulting selectively guided execution of similarity measures provides a reduction in search space, reducing the computational cost of the proposed algorithm. This multi-stage approach enhances the capability to perform image registration of low resolution imagery where scenes may have many structures but lack well defined structures for conventional feature extraction or lack to have enough variations in the intensity values to diminish statistical dependencies. The inherent statistical attributes of area-based methods are exploited through the sequential use of complex correlation and mutual information on physics-based features.
  • Keywords
    feature extraction; image registration; search problems; statistical analysis; affine translation; area-based methods; area-based similarity measure; computational cost reduction; feature extraction; hybrid feature-based similarity measure; hybrid similarity-measures; partially overlapped aerial imagery registration; physics-based features; rotation transformations; search space reduction; statistical dependencies; two-phase image registration technique; Correlation; Estimation; Feature extraction; Image registration; Mutual information; Wavelet transforms; aerial imagery; image registration; mutual information; normalized cross-correlation; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, NAECON 2014 - IEEE National
  • Print_ISBN
    978-1-4799-4690-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2014.7045779
  • Filename
    7045779