DocumentCode :
3564466
Title :
Multilayered coupled-microstrip lines technique with aperture compensation for innovative planar filter design
Author :
Zhu, Lei ; Wu, Ke
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech., Montreal, Que., Canada
Volume :
2
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
303
Abstract :
A coupled-microstrip lines (CML) structure with a backside aperture is proposed for use in the innovative design of M(H)MIC-based multilayered bandpass filters. This aperture technique is used to compensate the coupling characteristics of CML. With the “short-open calibration” (SOC) scheme self-contained in our full-wave method of moments (MoM), its parametric coupling behavior is investigated in detail. The SOC-extracted lumped circuit parameters are expressed in terms of Y-matrix and J-inverter network, respectively. Our obtained results show the attractive merits of the proposed technique in enhancing the desired coupling, which is useful for the design and realization of a low-loss wide bandpass filter using the 3-D multilayered M(H)MIC technology
Keywords :
MMIC; band-pass filters; compensation; hybrid integrated circuits; method of moments; microstrip circuits; microstrip filters; microwave integrated circuits; passive filters; 3D multilayered M(H)MIC technology; J-inverter network; SOC scheme; Y-matrix; aperture compensation; backside aperture; coupling characteristics; full-wave MoM; full-wave method of moments; low-loss wideband filter; lumped circuit parameters; multilayered bandpass filters; multilayered coupled-microstrip lines technique; parametric coupling behavior; planar filter design; short-open calibration scheme; Apertures; Band pass filters; Coupling circuits; Dielectrics; Fabrication; Filtering; Message-oriented middleware; Microstrip filters; Moment methods; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1999 Asia Pacific
Print_ISBN :
0-7803-5761-2
Type :
conf
DOI :
10.1109/APMC.1999.829811
Filename :
829811
Link To Document :
بازگشت