• DocumentCode
    3564558
  • Title

    AC conductivity parameters of graphene films with THz spectroscopy

  • Author

    Zhang, W.-D. ; Brown, E.R. ; Pham, Phi H. O. ; Burke, P.

  • Author_Institution
    Depts. of Phys. & Electr. Eng., Wright State Univ., Dayton, OH, USA
  • fYear
    2014
  • Firstpage
    310
  • Lastpage
    312
  • Abstract
    The complex conductivity of CVD-grown graphene films between 0.1 and 1.6 THz are obtained using a non-destructive THz etalon transmittance technique. Critical parameters such as ionized-impurity scattering width and chemical potential are derived. The technique can be extended to extract the complex ac conductivity parameters of other thin conducting films or 2DEG materials with high sheet conductance.
  • Keywords
    CVD coatings; chemical potential; electrical conductivity; graphene; terahertz wave spectra; thin films; 2DEG materials; C; CVD-grown graphene films; THz spectroscopy; chemical potential; complex AC conductivity parameters; frequency 0.1 THz to 1.6 THz; ionized-impurity scattering; nondestructive THz etalon transmittance; sheet conductance; thin conducting films; Conductivity; Films; Fitting; Graphene; Silicon; Substrates; 2D; Graphene; THz; Transmittance; conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, NAECON 2014 - IEEE National
  • Print_ISBN
    978-1-4799-4690-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2014.7045824
  • Filename
    7045824
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3564558