Title :
Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)
Author :
Deppensmith, Randall D. ; Stone, Samuel J.
Author_Institution :
Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Abstract :
Device discrimination using RF-DNA utilizes the uniqueness resulting from integrated circuit (IC) manufacturing process variation. As an IC ages toward wear-out failure, internal physical alterations may impart additional changes on the order of initial process variations. This paper proposes exploration of: 1) the impact of aging on RF-DNA discrimination reliability, and 2) a means to monitor IC aging using RF-DNA.
Keywords :
ageing; failure analysis; fingerprint identification; integrated circuit manufacture; integrated circuit reliability; IC aging effect; RF-DNA; device discrimination; device specific fingerprint; integrated circuit manufacturing process variation; internal physical alteration; radiofrequency distinct native attribute; wear-out failure; Aging; Fingerprint recognition; Human computer interaction; Integrated circuit reliability; Integrated circuits; Sensors; RF-DNA; process variation; wear-out failure;
Conference_Titel :
Aerospace and Electronics Conference, NAECON 2014 - IEEE National
Print_ISBN :
978-1-4799-4690-7
DOI :
10.1109/NAECON.2014.7045830
