DocumentCode :
3564607
Title :
Parametric model extraction for MEMS based on variational finite element techniques
Author :
Mehner, Jan E. ; Schaporin, Alexey ; Kolchuzhin, Vladimir ; Doetzel, Wolfram ; Gessner, Thomas
Author_Institution :
Dept. Micro Devices & Equip., Fraunhofer Inst. for Reliability & Microintegration, Germany
Volume :
1
fYear :
2005
Firstpage :
776
Abstract :
This article is focused on new finite element technologies which account for parameter variations in a single finite element run. The key idea of the new approach is to compute not only the governing system matrices of the FE problem but also n high order partial derivatives with regard to design parameters by means of automatic differentiation (AD). As result, Taylor vectors of the system´s response can be expanded in the vicinity of the initial position capturing dimensions and physical parameter. Essential speed-up can be achieved for shape optimization, sensitivity analyses and data sampling needed for reduced order modeling of MEMS.
Keywords :
differentiation; finite element analysis; micromechanical devices; partial differential equations; reduced order systems; variational techniques; FE system matrices; MEMS parametric model extraction; Taylor series expansion; automatic differentiation; data sampling; high order partial derivatives; reduced order modeling; sensitivity analyses; shape optimization; system response Taylor vectors; variational finite element techniques; Capacitive sensors; Electromagnetic devices; Electromagnetic fields; Finite element methods; Micromechanical devices; Parametric statistics; Precision engineering; Reduced order systems; Sensitivity analysis; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
Type :
conf
DOI :
10.1109/SENSOR.2005.1496532
Filename :
1496532
Link To Document :
بازگشت