DocumentCode
356485
Title
A very low failure rate of COD free high power 0.98 /spl mu/m laser diode with the window structure
Author
Yamamura, S. ; Hanamaki, Y. ; Kawasaki, K. ; Shigihara, K. ; Nagai, Y. ; Nlshinura, T. ; Omura, E.
Author_Institution
High Frequency & Opt. Semicond. Div., Mitsubishi Electr. Corp., Itami, Japan
Volume
3
fYear
2000
fDate
7-10 March 2000
Firstpage
162
Abstract
A very low failure rate of a 0.98 /spl mu/m laser diode is reported. COD free characteristics is realized. The cumulative failure rate 0.4% for wear-out and 5.6% for sudden failure is estimated 25 years later at 25 C-250 mW.
Keywords
laser beams; laser reliability; ridge waveguides; semiconductor device reliability; semiconductor lasers; waveguide lasers; 0.98 mum; 25 C; 250 mW; catastrophic optical damage; catastrophic optical damage free characteristics; cumulative failure rate; failure rate; high power laser diode; laser diode; sudden failure; wear-out; window structure; Acceleration; Aging; Annealing; Degradation; Diode lasers; Optical pumping; Optical waveguides; Power generation; Stimulated emission; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Communication Conference, 2000
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-630-3
Type
conf
DOI
10.1109/OFC.2000.868552
Filename
868552
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