Title :
Resistive Memories for Ultra-Low-Power embedded computing design
Author :
Vianello, E. ; Thomas, O. ; Molas, G. ; Turkyilmaz, O. ; Jovanovic, N. ; Garbin, D. ; Palma, G. ; Alayan, M. ; Nguyen, C. ; Coignus, J. ; Giraud, B. ; Benoist, T. ; Reyboz, M. ; Toffoli, A. ; Charpin, C. ; Clermidy, F. ; Perniola, L.
Author_Institution :
LETI, CEA, Grenoble, France
Abstract :
This paper addresses two technologies as an example of optimized devices for FPGA and fixed-logic IC design (as non volatile Flip-Flops). In FPGAs, the replacement of the SRAM based configuration memory with ReRAM allows saving area and suppressing the standby power consumption. Although the non-volatility eliminates standby power consumption, the leakage current through the ReRAM during run time depends on the high resistive state (HRS) value. A Conductive Bridge RAM (CBRAM) cell with dual-layer electrolyte stack with a resistance ratio higher than 106 has been proposed to minimize the leakage current in the operating mode. The introduction of ReRAM in fixed-logic IC circuits allows unifying non-volatility, zero standby leakage, and rapid power on/off operations. Endurance, low operating voltage and high speed are the main ReRAM specifications to enable the design of non-volatile Flip-Flop with fast switching. An HfO2/Ti based OxRAM cell with a switching time lower than 10ns at 1V and a high endurance up to 108 cycles has been proposed for this application.
Keywords :
bridge circuits; field programmable gate arrays; flip-flops; hafnium compounds; leakage currents; logic CAD; low-power electronics; power consumption; resistive RAM; titanium; CBRAM cell; FPGA; HRS value; HfO2-Ti; OxRAM cell; ReRAM; SRAM based configuration memory; conductive bridge RAM cell; device optimization; dual-layer electrolyte stack; fast switching time; fixed-logic IC design; high resistive state value; leakage current minimization; low operating voltage; nonvolatile flip-flop; operating mode; power on-off operations; resistance ratio; resistive memory; run time; saving area; standby power consumption suppression; ultra low power embedded computing design; voltage 1 V; zero standby leakage; CMOS integrated circuits; Field programmable gate arrays; Hafnium compounds; Leakage currents; Programming; Resistance; Switches;
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
DOI :
10.1109/IEDM.2014.7046995