DocumentCode
3565205
Title
Challenge of MOS/MTJ-hybrid nonvolatile logic-in-memory architecture in dark-silicon era
Author
Hanyu, Takahiro ; Suzuki, Daisuke ; Mochizuki, Akira ; Natsui, Masanori ; Onizawa, Naoya ; Sugibayashi, Tadahiko ; Ikeda, Shoji ; Endoh, Tetsuo ; Ohno, Hideo
Author_Institution
Center for Spintronics Integrated Syst. (CSIS), Tohoku Univ., Sendai, Japan
fYear
2014
Abstract
In this paper, we present a new architecture-level approach, called “nonvolatile logic-in-memory (NV-LIM) architecture,” to solving performance-wall and power-wall problems due to the present CMOS-only-based logic-LSI processors. Figure 1(a) shows a conventional logic LSI chip architecture, where global interconnections between logic and volatile memory modules dominates performance and power dissipation as well as leakage power continuously consumed by volatile memories. In contrast, since nonvolatile storage elements such as magnetic tunnel junction (MTJ) devices are easily distributed over a logic-circuit plane by using a 3D stack structure as shown in Figure 1(b), performance degradation due to intra-chip global wires can be drastically mitigated, which leads to a high- performance, ultra-low-power and highly reliable (or highly resilient) logic LSI.
Keywords
CMOS logic circuits; elemental semiconductors; integrated circuit interconnections; large scale integration; magnetic tunnelling; random-access storage; silicon; 3D stack structure; CMOS-only-based logic-LSI processors; MOS-MTJ; Si; dark silicon era; global interconnections; hybrid NV-LIM architecture; hybrid nonvolatile logic-in-memory architecture; intra-chip global wires; leakage power; logic circuit plane; logic memory modules; magnetic tunnel junction; performance wall problem; power dissipation; power wall problem; volatile memory modules; Educational institutions; Large scale integration; Magnetic tunneling; Nonvolatile memory; Power dissipation; Program processors; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2014 IEEE International
Type
conf
DOI
10.1109/IEDM.2014.7047124
Filename
7047124
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