Title :
Challenge of MOS/MTJ-hybrid nonvolatile logic-in-memory architecture in dark-silicon era
Author :
Hanyu, Takahiro ; Suzuki, Daisuke ; Mochizuki, Akira ; Natsui, Masanori ; Onizawa, Naoya ; Sugibayashi, Tadahiko ; Ikeda, Shoji ; Endoh, Tetsuo ; Ohno, Hideo
Author_Institution :
Center for Spintronics Integrated Syst. (CSIS), Tohoku Univ., Sendai, Japan
Abstract :
In this paper, we present a new architecture-level approach, called “nonvolatile logic-in-memory (NV-LIM) architecture,” to solving performance-wall and power-wall problems due to the present CMOS-only-based logic-LSI processors. Figure 1(a) shows a conventional logic LSI chip architecture, where global interconnections between logic and volatile memory modules dominates performance and power dissipation as well as leakage power continuously consumed by volatile memories. In contrast, since nonvolatile storage elements such as magnetic tunnel junction (MTJ) devices are easily distributed over a logic-circuit plane by using a 3D stack structure as shown in Figure 1(b), performance degradation due to intra-chip global wires can be drastically mitigated, which leads to a high- performance, ultra-low-power and highly reliable (or highly resilient) logic LSI.
Keywords :
CMOS logic circuits; elemental semiconductors; integrated circuit interconnections; large scale integration; magnetic tunnelling; random-access storage; silicon; 3D stack structure; CMOS-only-based logic-LSI processors; MOS-MTJ; Si; dark silicon era; global interconnections; hybrid NV-LIM architecture; hybrid nonvolatile logic-in-memory architecture; intra-chip global wires; leakage power; logic circuit plane; logic memory modules; magnetic tunnel junction; performance wall problem; power dissipation; power wall problem; volatile memory modules; Educational institutions; Large scale integration; Magnetic tunneling; Nonvolatile memory; Power dissipation; Program processors; Random access memory;
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
DOI :
10.1109/IEDM.2014.7047124