Title :
Experimental demonstration and tolerancing of a large-scale neural network (165,000 synapses), using phase-change memory as the synaptic weight element
Author :
Burr, G.W. ; Shelby, R.M. ; di Nolfo, C. ; Jang, J.W. ; Shenoy, R.S. ; Narayanan, P. ; Virwani, K. ; Giacometti, E.U. ; Kurdi, B. ; Hwang, H.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
Using 2 phase-change memory (PCM) devices per synapse, a 3-layer perceptron network with 164,885 synapses is trained on a subset (5000 examples) of the MNIST database of handwritten digits using a backpropagation variant suitable for NVM+selector crossbar arrays, obtaining a training (generalization) accuracy of 82.2% (82.9%). Using a neural network (NN) simulator matched to the experimental demonstrator, extensive tolerancing is performed with respect to NVM variability, yield, and the stochasticity, linearity and asymmetry of NVM-conductance response.
Keywords :
backpropagation; multilayer perceptrons; phase change memories; 3-layer perceptron network; MNIST database; NN simulator; NVM variability; NVM-conductance response asymmetry; NVM-conductance response linearity; NVM-conductance response stochasticity; NVM-selector crossbar arrays; PCM devices; backpropagation variant; handwritten digits; large-scale neural network; phase-change memory; synaptic weight element; Accuracy; Artificial neural networks; Neurons; Nonvolatile memory; Phase change materials; Training; Weight measurement;
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
DOI :
10.1109/IEDM.2014.7047135