Title :
Polarization dependent loss study on silicon-wire waveguide tap for optical performance monitoring
Author :
Hsu, Shih-Hsiang
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei
Abstract :
The complex refractive index of reflective metal layer was integrated onto the direction-changing region, made by 54.7-degree angles from anisotropic silicon wet-etching, to compensate polarization dependent loss of the tapping signal power on silicon-wire waveguides.
Keywords :
etching; light polarisation; optical waveguides; refractive index; silicon; Si; anisotropic silicon wet-etching; complex refractive index; direction-changing region; optical performance monitoring; polarization dependent loss; reflective metal layer; silicon-wire waveguide tap; Anisotropic magnetoresistance; Geometrical optics; Monitoring; Optical losses; Optical polarization; Optical refraction; Optical variables control; Optical waveguides; Performance loss; Refractive index; (230.7380) optical devices; waveguides; channeled; (230.7390) optical devices; waveguides, planar; (250.5300) optoelectronics; photonic integrated circuits;
Conference_Titel :
Optical Fiber Communication - incudes post deadline papers, 2009. OFC 2009. Conference on
Print_ISBN :
978-1-4244-2606-5
Electronic_ISBN :
978-1-55752-865-0
