DocumentCode :
3565768
Title :
Pros and cons of laser C2 reflow process by high power diode laser
Author :
Cheung, Y.M. ; Zetao Ma ; Kai Ming Yeung
Author_Institution :
Watson Centre, ASM Technol. Hong Kong, Hong Kong, China
fYear :
2014
Firstpage :
45
Lastpage :
48
Abstract :
As the I/O density and speed of electronic devices increase dramatically, fine pitch copper-pillar flip chip becomes a very popular choice of technology for high density interconnects. The bonding processes for these packages are classified as post-applied underfill bonding processes and pre-applied underfill bonding processes [1-3]. These bonding processes have been studied intensely. Robustness of the bonding process and integrity of resulting solder joints are critical to ensure high assembly yield and high product reliability. On the other hand, these assembly processes have to achieve reasonable throughput in order to lower the assembly cost.
Keywords :
assembling; bonding processes; copper; fine-pitch technology; flip-chip devices; reflow soldering; semiconductor device reliability; semiconductor lasers; I-O density; electronic device speed; fine pitch copper-pillar flip chip; high assembly yield cost process; high density interconnects; high power diode laser; high product reliability; laser C2 reflow process; postapplied underfill bonding processes; preapplied underfill bonding processes; pros and cons; solder joints; Heating; Laser beams; Power lasers; Silicon; Soldering; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2014 9th International
Type :
conf
DOI :
10.1109/IMPACT.2014.7048360
Filename :
7048360
Link To Document :
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