Title :
Statistical characterization of bit patterning in SOAs: BER prediction and experimental validation
Author :
Ghazisaeidi, Amirhossein ; Vacondio, Francesco ; Bononi, Alberto ; Rusch, Leslie Ann
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. Laval, Quebec City, QC
Abstract :
We present a novel simulation tool for optical systems employing in-line nonlinear SOAs, able to correctly estimate the bit error rate even in the presence of significant SOA-induced intersymbol interference.
Keywords :
error statistics; intersymbol interference; semiconductor optical amplifiers; BER prediction; SOA-induced intersymbol interference; bit error rate; bit patterning; optical systems; statistical characterization; Bit error rate; Computational modeling; Fiber nonlinear optics; Intersymbol interference; Optical fiber communication; Optical filters; Optical receivers; Optical wavelength conversion; Repeaters; Semiconductor optical amplifiers; (060.2330) Fiber optics communications;
Conference_Titel :
Optical Fiber Communication - incudes post deadline papers, 2009. OFC 2009. Conference on
Print_ISBN :
978-1-4244-2606-5
Electronic_ISBN :
978-1-55752-865-0
