DocumentCode :
3566704
Title :
Transient detection of close components through the chirplet transform: Rotor faults in inverter-fed induction motors
Author :
Pons-Llinares, J. ; Morinigo-Sotelo, D. ; Duque-Perez, O. ; Antonino-Daviu, J. ; Perez-Alonso, M.
Author_Institution :
Inst. de Ing. Energetica, Univ. Politec. de Valencia, Valencia, Spain
fYear :
2014
Firstpage :
3386
Lastpage :
3392
Abstract :
Up to now, detection of rotor faults in inverter-fed induction motors has received very little attention. This fault is difficult to be detected, since the fault-related components are too close to the fundamental (the inverter usually operates at low slip). Moreover, classic techniques cannot be applied since steady states are not common. The causes of this type of fault are analyzed in the paper, showing its importance. Particularly, cases of real faults in electric traction are exposed. Then, the paper explores the use of linear time-frequency transforms to detect the time-frequency evolution of the fault-related components. It is shown how the most common linear transforms, such as the Short Time Fourier Transform, do not enable the fault detection. The Chirplet Transform (which has never been used for diagnosing purposes), is proposed to obtain the components evolutions, even if they are too close in the time-frequency plane. The technique is validated through startup tests, in which the presence of the fault is quantified when analyzing the stator current.
Keywords :
Fourier transforms; fault diagnosis; induction motors; invertors; rotors; stators; traction; chirplet transform; close components transient detection; electric traction; fault detection; inverter-fed induction motors; linear time-frequency transforms; rotor faults detection; short time Fourier transform; stator current; time-frequency evolution; Atomic clocks; Atomic measurements; Harmonic analysis; Induction motors; Inverters; Rotors; Transforms; bar brekage; chirplet transform; fault diagnosis; induction motors; time-frequency analysis; transient analysis; voltage source inverter; wavelet transform; wigner ville distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
Type :
conf
DOI :
10.1109/IECON.2014.7048999
Filename :
7048999
Link To Document :
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