DocumentCode :
3566737
Title :
Evaluation of CdZnTe detector for personal surveymeter applications
Author :
Lee, H.K. ; Choi, M.J.
Author_Institution :
Agency for Defense Dev., Daejeon, South Korea
Volume :
2
fYear :
1996
Firstpage :
848
Abstract :
In this paper, we report the fabrication and characterization of the personal surveymeter using home made Cd0.8Zn0.2Te detector for the field application. The detector structure is bulk type and an Au electrode is formed by an electroless deposition method. The properties of the Au film were analyzed by the AFM, RBS and Auger spectroscopy. The reliability test results showed that TO-5 packaged CdZnTe detector had good stability. When the detector bias voltage was higher, the detector response was more stable at low temperature. The personal surveymeter also showed good linear response for a gamma dose rate from 1 mRad/hr to 500 Rad/hr
Keywords :
Auger effect; Rutherford backscattering; atomic force microscopy; dosimeters; electrodes; electroless deposition; semiconductor counters; Au; Au electrode; Au film; Auger spectroscopy; Cd0.8Zn0.2Te; CdZnTe detector; Rutherford backscattering; atomic force microscopy; bias voltage; bulk type; electroless deposition method; fabrication; linear response; low temperature; personal surveymeter; response; Detectors; Electrodes; Fabrication; Gold; Packaging; Spectroscopy; Stability; Tellurium; Testing; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-3534-1
Type :
conf
DOI :
10.1109/NSSMIC.1996.591470
Filename :
591470
Link To Document :
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