Title :
Vulnerability identification and classification via text mining bug databases
Author :
Wijayasekara, Dumidu ; Manic, Milos ; McQueen, Miles
Author_Institution :
Univ. of Idaho, Idaho Falls, ID, USA
Abstract :
As critical and sensitive systems increasingly rely on complex software systems, identifying software vulnerabilities is becoming increasingly important. It has been suggested in previous work that some bugs are only identified as vulnerabilities long after the bug has been made public. These bugs are known as Hidden Impact Bugs (HIBs). This paper presents a hidden impact bug identification methodology by means of text mining bug databases. The presented methodology utilizes the textual description of the bug report for extracting textual information. The text mining process extracts syntactical information of the bug reports and compresses the information for easier manipulation. The compressed information is then utilized to generate a feature vector that is presented to a classifier. The proposed methodology was tested on Linux vulnerabilities that were discovered in the time period from 2006 to 2011. Three different classifiers were tested and 28% to 88% of the hidden impact bugs were identified correctly by using the textual information from the bug descriptions alone. Further analysis of the Bayesian detection rate showed the applicability of the presented method according to the requirements of a development team.
Keywords :
Bayes methods; Linux; data mining; pattern classification; program debugging; text analysis; Bayesian detection rate; HIB; Linux vulnerabilities; bug database text mining; complex software systems; compressed information; critical systems; feature vector; hidden impact bug identification methodology; sensitive systems; software vulnerabilities; textual description; vulnerability classification; vulnerability identification; Computer bugs; Databases; Linux; Software; Text mining; Time division multiplexing; bug database mining; classification; hidden impact bugs; text mining; vulnerability discovery;
Conference_Titel :
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
DOI :
10.1109/IECON.2014.7049035