Title :
Mobile radio link analysis for wireless communications
Author :
Sun, Jonqyin ; Reed, Irving S.
Author_Institution :
Commun. Sci. Inst., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
Closed-form solutions for the average error rate of MDPSK, coherent MPSK and noncoherent MFSK over slow, flat, Rician fading channels are derived. The solutions are sufficiently simple so that no approximations are needed for the numerical computations and are general enough so that it includes AWGN and Rayleigh fading as special cases. Error probabilities are graphically displayed for various values of M. The dependence of the error rate on the channel specular-to-scatter ratio are plotted and examined. Performance comparisons for a range of values of the Rician parameter K, corresponding with the measured statistics of indoor wireless channels, are made for the different digital modulation schemes. The analytical results presented are expected to provide information that is important for radio systems design and the evaluation of performance over a fading channel
Keywords :
Gaussian channels; Rayleigh channels; Rician channels; differential phase shift keying; error statistics; fading; frequency shift keying; indoor radio; land mobile radio; phase shift keying; radio links; radiowave propagation; AWGN; MDPSK; Rayleigh fading; Rician fading channels; Rician parameter; average error rate; channel specular-to-scatter ratio; closed-form solutions; coherent MPSK; digital modulation; error probabilities; error rate; flat fading channels; indoor wireless channels; measured statistics; mobile radio link analysis; noncoherent MFSK; performance evaluation; radio propagation characteristics; radio systems design; slow fading channels; wireless communications; AWGN; Closed-form solution; Digital modulation; Error analysis; Error probability; Land mobile radio; Rayleigh channels; Rician channels; Statistics; Wireless communication;
Conference_Titel :
Vehicular Technology Conference, 1996. Mobile Technology for the Human Race., IEEE 46th
Print_ISBN :
0-7803-3157-5
DOI :
10.1109/VETEC.1996.503424