• DocumentCode
    3567305
  • Title

    CMOS compatible micromachined resonators

  • Author

    Moore, D.F. ; Lutwyche, M.I. ; Hoole, A.C.F.

  • Author_Institution
    Dept. of Eng., Cambridge Univ., UK
  • fYear
    1993
  • fDate
    12/2/1993 12:00:00 AM
  • Firstpage
    42430
  • Lastpage
    42432
  • Abstract
    This paper outlines the present status and future prospects for micromachining silicon. Suspended microstructures can be deflected electrostatically to open and close tunnel gaps. Possible applications of micromechanical structures include resonators, accelerometers, sensors and integrated scanning probe microscopes
  • Keywords
    CMOS integrated circuits; accelerometers; electric sensing devices; integrated circuit technology; micromechanical devices; resonators; CMOS compatible micromachined resonators; Si micromachining; accelerometers; integrated scanning probe microscopes; micromechanical structures; microstructures; semiconductor; sensors;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Measurement Using Resonant Sensing, IEE Colloquium on
  • Type

    conf

  • Filename
    289060