Title :
On-wafer probing at 140 GHz (MMICs)
Author_Institution :
Electron. Eng. Labs., Kent Univ., Canterbury, UK
fDate :
7/15/1894 12:00:00 AM
Abstract :
This paper describes some research work that will be carried out with the support of the SERC over the next three years. The work is part of a larger grant which involves the production of MMICs at 140 GHz. The author´s contribution to this research is to provide the measurement facility for on-wafer probing at these frequencies. Two problems arise at the out-set, which are the lack of commercial network analysers and the high attenuation of metallic waveguides at 140 GHz. The paper describes an alternative to a network analyser which the author has already used for measurements in the range 70-110 GHz (Collier and D´Souza, 1991). Also the paper discusses a technique which avoids the problems of metallic waveguide. Finally some comments are made about probes for these frequencies.<>
Keywords :
MMIC; integrated circuit testing; microwave measurement; probes; 140 GHz; MMIC; metallic waveguide attenuation; network analysers; on-wafer probing; Integrated circuit testing; MMICs; Microwave measurements;
Conference_Titel :
What's New in Microwave Measurements (Digest No.1994/042), IEE Colloquium on