Conducted susceptibility measurements on integrated circuits

Outlines a research programme covering the development and evaluation of the microwave susceptibility characteristics of integrated circuits (ICs). Tests will be carried out to investigate the variation between component batches, device technologies and various device manufacturers. The research programme has been formulated/funded by the DRA, Civil Aircraft EMC Research clubs (CAEC), under EUREKA project 461. This phase of the research programme has been subdivided to cover the development/evaluation of jigs designed to carry out conducted susceptibility testing of Dual Inline (DIL) and Surface Mount (SMD) devices. This paper essentially covers the progress made in the evaluation of the test methodology for testing DIL devices. In parallel to the conducted susceptibility measurement programme being carried out at DRA, Farnborough, there is a programme being carried out by GEC Marconi, also funded by the CAEC, carrying out research into the radiated susceptibility testing of integrated circuits