Is there a correlation between ESD qualification values and the voltages measured in the field?

Nearly all semiconductor devices are stressed according Human Body Model (HBM) and Charged Device Model (CDM) during qualification with a defined current pulse. People in the manufacturing environment are measuring electrostatic voltages on operators, devices, boards or system and try to correlate these values with the robustness values in the datasheets. The paper describes whether this is possible and illustrates the statements with some case studies. The paper also highlights that there are still some field problems that cannot be reproduced with these device qualification test methods.